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An Efficient Scan Tree Design for Test Time Reduction

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108901
Contributor : Christine Carvalho de Matos <>
Submitted on : Monday, October 23, 2006 - 12:57:11 PM
Last modification on : Friday, November 27, 2020 - 6:04:03 PM

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Yannick Bonhomme, Tomohiro Yoneda, Hideo Fujiwara, Patrick Girard. An Efficient Scan Tree Design for Test Time Reduction. ETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.174-179, ⟨10.1109/ETSYM.2004.1347657⟩. ⟨lirmm-00108901⟩

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