Conference Papers
Year : 2004
Christine Carvalho De Matos : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108902
Submitted on : Monday, October 23, 2006-12:57:11 PM
Last modification on : Friday, March 24, 2023-2:52:48 PM
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- HAL Id : lirmm-00108902 , version 1
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Piet Engelke, I. Polian, Michel Renovell, P. Becker. Automatic Test Pattern Generation for Resistive Bridging Faults. ETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.160-165. ⟨lirmm-00108902⟩
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