User-Constrained Test Architecture Design for Modular SOC Testing

L. Krundel; S. Kumar Goel; E.J. Marinissen; Marie-Lise Flottes; Bruno Rouzeyre

doi:10.1109/ETSYM.2004.1347611

Conference Papers Year : 2004

User-Constrained Test Architecture Design for Modular SOC Testing

, , , (1) , (1)

1

L. Krundel

Function : Author

S. Kumar Goel

Function : Author

E.J. Marinissen

Function : Author

Marie-Lise Flottes

Function : Author
PersonId : 3580
IdHAL : marie-lise-flottes
ORCID : 0000-0002-7231-3976
IdRef : 142992321

Conception et Test de Systèmes MICroélectroniques

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Bruno Rouzeyre

Function : Author
PersonId : 22024
IdHAL : bruno-rouzeyre
IdRef : 07124705X

Conception et Test de Systèmes MICroélectroniques

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108903

Submitted on : Monday, October 23, 2006-12:57:12 PM

Last modification on : Friday, March 24, 2023-2:52:48 PM

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lirmm-00108903 , version 1 (23-10-2006)

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HAL Id : lirmm-00108903 , version 1
DOI : 10.1109/ETSYM.2004.1347611

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L. Krundel, S. Kumar Goel, E.J. Marinissen, Marie-Lise Flottes, Bruno Rouzeyre. User-Constrained Test Architecture Design for Modular SOC Testing. ETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.80-85, ⟨10.1109/ETSYM.2004.1347611⟩. ⟨lirmm-00108903⟩

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