Conference Papers
Year : 2004
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00109135
Submitted on : Tuesday, October 24, 2006-7:31:54 AM
Last modification on : Friday, March 24, 2023-2:52:48 PM
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- HAL Id : lirmm-00109135 , version 1
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Michel Renovell. Fundamentals of System Testing: Challenges for System-On-Chips. ICM'04: 16th International Conference on Microelectronics, Dec 2004, P., France. pp.176-180. ⟨lirmm-00109135⟩
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