“Analogue Network of Converters”: A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC
Abstract
In this paper, complex mixed signal circuits such as SiP or SOC including several ADCs and DACs are considered. A new DFT technique is proposed allowing the test of this complete set of embedded ADCs and DACs in a fully digital way such that only a simple low cost tester can be used. Moreover, this technique called “Analogue Network of Converters” (ANC) requires an extremely simple additional circuitry and interconnect
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