“Analogue Network of Converters”: A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC

Abstract : In this paper, complex mixed signal circuits such as SiP or SOC including several ADCs and DACs are considered. A new DFT technique is proposed allowing the test of this complete set of embedded ADCs and DACs in a fully digital way such that only a simple low cost tester can be used. Moreover, this technique called “Analogue Network of Converters” (ANC) requires an extremely simple additional circuitry and interconnect
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Communication dans un congrès
ETS: European Test Symposium, May 2006, Southampton, United Kingdom. 11th IEEE European Test Symposium, pp.159-164, 2006
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Contributeur : Serge Bernard <>
Soumis le : mercredi 22 novembre 2006 - 16:06:48
Dernière modification le : vendredi 20 juillet 2018 - 12:34:01
Document(s) archivé(s) le : mardi 6 avril 2010 - 23:14:40

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Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Vincent Kerzérho, et al.. “Analogue Network of Converters”: A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS: European Test Symposium, May 2006, Southampton, United Kingdom. 11th IEEE European Test Symposium, pp.159-164, 2006. 〈lirmm-00115676〉

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