Low Power Testing

Abstract : Power dissipation has become the major design objective in many application areas, ranging from wireless communicatins to high performance computing, thus leading to the production of numerous so-called low power designs.
Type de document :
Communication dans un congrès
WRTLT'06: 7th Workshop on RTL and High Level Testing, Nov 2006, Fukuoka, pp.4, 2006
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00116819
Contributeur : Martine Peridier <>
Soumis le : mardi 28 novembre 2006 - 11:15:10
Dernière modification le : jeudi 11 janvier 2018 - 06:27:18

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  • HAL Id : lirmm-00116819, version 1

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Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel. Low Power Testing. WRTLT'06: 7th Workshop on RTL and High Level Testing, Nov 2006, Fukuoka, pp.4, 2006. 〈lirmm-00116819〉

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