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Low Power Testing

Abstract : Power dissipation has become the major design objective in many application areas, ranging from wireless communicatins to high performance computing, thus leading to the production of numerous so-called low power designs.
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Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00116819
Contributor : Martine Peridier <>
Submitted on : Tuesday, November 28, 2006 - 11:15:10 AM
Last modification on : Friday, November 27, 2020 - 6:04:03 PM

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  • HAL Id : lirmm-00116819, version 1

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Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel. Low Power Testing. WRTLT'06: 7th Workshop on RTL and High Level Testing, Nov 2006, Fukuoka, pp.4. ⟨lirmm-00116819⟩

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