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Conference Papers Year : 2006

Low Power Testing

Abstract

Power dissipation has become the major design objective in many application areas, ranging from wireless communicatins to high performance computing, thus leading to the production of numerous so-called low power designs.

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Dates and versions

lirmm-00116819 , version 1 (28-11-2006)

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  • HAL Id : lirmm-00116819 , version 1

Cite

Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel. Low Power Testing. WRTLT'06: 7th Workshop on RTL and High Level Testing, Nov 2006, Fukuoka, pp.4. ⟨lirmm-00116819⟩
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