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Conference papers

Power-Aware Test Data Compression for Embedded IP Core

Abstract : Scan architectures, though widely used in modern designs for testing purpose, are expensive in test data volume and power consumption.
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Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00116832
Contributor : Martine Peridier <>
Submitted on : Tuesday, November 28, 2006 - 11:41:14 AM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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  • HAL Id : lirmm-00116832, version 1

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Citation

Nabil Badereddine, Z. Wang, Patrick Girard, K. Chakrabarty, Arnaud Virazel, et al.. Power-Aware Test Data Compression for Embedded IP Core. ATS: Asian Test Symposium, Nov 2006, Fukuoka, Japan. pp.5-10. ⟨lirmm-00116832⟩

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