A Gated Clock Scheme for Low Power Testing of Logic Cores - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Journal Articles Journal of Electronic Testing: : Theory and Applications Year : 2006

A Gated Clock Scheme for Low Power Testing of Logic Cores

Abstract

Test power is now a big concern in large core-based systems. In this paper, we present a general approach for minimizing power consumption during test of integrated circuits or embedded cores. The proposed low power/energy technique is based on a gated clock scheme that can be used in a test-per-scan or a test-per-clock environment. The idea is to reduce the clock rate on the scan path (test-per-scan) or the test pattern generator (test-per-clock) without increasing the test time. Numerous advantages can be found in applying such a technique.

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Dates and versions

lirmm-00134766 , version 1 (05-03-2007)

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Christian Landrault, Yannick Bonhomme, Arnaud Virazel, Patrick Girard, Loïs Guiller, et al.. A Gated Clock Scheme for Low Power Testing of Logic Cores. Journal of Electronic Testing: : Theory and Applications, 2006, 22 (1), pp.89-99. ⟨10.1007/s10836-006-6259-1⟩. ⟨lirmm-00134766⟩
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