AES vs LFSR Based Test Pattern Generation: A Comparative Study

Abstract : The massive integration of several functionalities leads to increased test times/test data volume. Additionally, test content for more advanced fault models increase the tester memory requirements. On the positive side, the presence of many cores in a system provides the opportunity of core testing each other. In this paper we evaluate the opportunity to use AES crypto- processors as test pattern generators. Several experiences are conducted on LFSRs and AES cores in order to compare their ability to generate pseudo-random test sequences.
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Communication dans un congrès
LATW: Latin American Test Workshop, Mar 2007, Cuzco, Peru. IEEE, 8th IEEE Latin American Test Workshop, pp.314-321, 2007
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00138831
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Soumis le : samedi 21 janvier 2017 - 21:23:00
Dernière modification le : jeudi 24 mai 2018 - 15:59:24
Document(s) archivé(s) le : samedi 22 avril 2017 - 13:02:20

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Marion Doulcier, Marie-Lise Flottes, Bruno Rouzeyre. AES vs LFSR Based Test Pattern Generation: A Comparative Study. LATW: Latin American Test Workshop, Mar 2007, Cuzco, Peru. IEEE, 8th IEEE Latin American Test Workshop, pp.314-321, 2007. 〈lirmm-00138831〉

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