AES vs LFSR Based Test Pattern Generation: A Comparative Study - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2007

AES vs LFSR Based Test Pattern Generation: A Comparative Study

Abstract

The massive integration of several functionalities leads to increased test times/test data volume. Additionally, test content for more advanced fault models increase the tester memory requirements. On the positive side, the presence of many cores in a system provides the opportunity of core testing each other. In this paper we evaluate the opportunity to use AES crypto- processors as test pattern generators. Several experiences are conducted on LFSRs and AES cores in order to compare their ability to generate pseudo-random test sequences.
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Dates and versions

lirmm-00138831 , version 1 (21-01-2017)

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  • HAL Id : lirmm-00138831 , version 1

Cite

Marion Doulcier, Marie-Lise Flottes, Bruno Rouzeyre. AES vs LFSR Based Test Pattern Generation: A Comparative Study. LATW: Latin American Test Workshop, Mar 2007, Cuzco, Peru. pp.314-321. ⟨lirmm-00138831⟩
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