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AES vs LFSR Based Test Pattern Generation: A Comparative Study

Abstract : The massive integration of several functionalities leads to increased test times/test data volume. Additionally, test content for more advanced fault models increase the tester memory requirements. On the positive side, the presence of many cores in a system provides the opportunity of core testing each other. In this paper we evaluate the opportunity to use AES crypto- processors as test pattern generators. Several experiences are conducted on LFSRs and AES cores in order to compare their ability to generate pseudo-random test sequences.
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Contributor : Martine Peridier <>
Submitted on : Saturday, January 21, 2017 - 9:23:00 PM
Last modification on : Tuesday, October 23, 2018 - 10:46:02 AM
Long-term archiving on: : Saturday, April 22, 2017 - 1:02:20 PM


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  • HAL Id : lirmm-00138831, version 1



Marion Doulcier, Marie-Lise Flottes, Bruno Rouzeyre. AES vs LFSR Based Test Pattern Generation: A Comparative Study. LATW: Latin American Test Workshop, Mar 2007, Cuzco, Peru. pp.314-321. ⟨lirmm-00138831⟩



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