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Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00151034
Contributor : Martine Peridier <>
Submitted on : Friday, June 1, 2007 - 2:53:19 PM
Last modification on : Friday, November 27, 2020 - 6:04:03 PM

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  • HAL Id : lirmm-00151034, version 1

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Olivier Ginez, Jean-Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, et al.. Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window. VTS'07: 25th IEEE VLSI Test Symposium, May 2007, Berkeley, CA (USA), pp.47-52. ⟨lirmm-00151034⟩

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