Skip to Main content Skip to Navigation
Poster communications

Logic Errors in CMOS Circuits due to Simultaneous Switching Noise

Document type :
Poster communications
Complete list of metadatas

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00154744
Contributor : Martine Peridier <>
Submitted on : Thursday, June 14, 2007 - 3:35:14 PM
Last modification on : Friday, July 20, 2018 - 12:34:01 PM

Identifiers

  • HAL Id : lirmm-00154744, version 1

Collections

Citation

Florence Azaïs, Laurent Larguier, Michel Renovell. Logic Errors in CMOS Circuits due to Simultaneous Switching Noise. ETS: European Test Symposium, May 2007, Freiburg, Germany. 12th IEEE European Test Symposium, pp.59-64, 2007. ⟨lirmm-00154744⟩

Share

Metrics

Record views

96