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Poster communications

TAM Design and Test Data Compression for SoC Test Cost Reduction

Abstract : TAM Design and Test Data Compression for SoC Test Cost Reduction
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Poster communications
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00159044
Contributor : Martine Peridier <>
Submitted on : Monday, November 12, 2007 - 4:50:50 PM
Last modification on : Tuesday, October 23, 2018 - 10:46:02 AM
Long-term archiving on: : Thursday, April 8, 2010 - 10:14:10 PM

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  • HAL Id : lirmm-00159044, version 1

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Julien Dalmasso, Marie-Lise Flottes, Bruno Rouzeyre. TAM Design and Test Data Compression for SoC Test Cost Reduction. ETS: European Test Symposium, May 2007, Freiburg, Germany. 12th IEEE European Test Symposium, pp.241-246, 2007. ⟨lirmm-00159044⟩

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