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Conference Poster Year : 2007

TAM Design and Test Data Compression for SoC Test Cost Reduction

Abstract

TAM Design and Test Data Compression for SoC Test Cost Reduction
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Dates and versions

lirmm-00159044 , version 1 (12-11-2007)

Identifiers

  • HAL Id : lirmm-00159044 , version 1

Cite

Julien Dalmasso, Marie-Lise Flottes, Bruno Rouzeyre. TAM Design and Test Data Compression for SoC Test Cost Reduction. ETS: European Test Symposium, May 2007, Freiburg, Germany. 12th IEEE European Test Symposium, pp.241-246, 2007. ⟨lirmm-00159044⟩
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