Slow Write Driver Faults in 65nm SRAM Technology: Analysis and March Test Solution

Abstract : This paper presents an analysis of the electrical origins of Slow Write Driver Faults (SWDFs) [1] that may affect SRAM write drivers in 65nm technology. This type of fault is the consequence of resistive-open defects in the control part of the write driver. It involves an erroneous write operation when the same write driver performs two successive write operations with opposite data values. In the first part of the paper, we present the SWDF electrical phenomena and their consequences on the SRAM functioning. Next, we show how SWDFs can be sensitized and observed and how a standard March test is able to detect this type of fault.
Type de document :
Communication dans un congrès
DATE: Design, Automation and Test in Europe, Apr 2007, Nice, France. pp.528-533, 2007, 〈10.1109/DATE.2007.364647〉
Liste complète des métadonnées

Littérature citée [5 références]  Voir  Masquer  Télécharger

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00187037
Contributeur : Martine Peridier <>
Soumis le : mardi 11 décembre 2007 - 14:55:12
Dernière modification le : jeudi 24 mai 2018 - 15:59:24
Document(s) archivé(s) le : lundi 12 avril 2010 - 02:03:09

Fichier

Identifiants

Collections

Citation

Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, et al.. Slow Write Driver Faults in 65nm SRAM Technology: Analysis and March Test Solution. DATE: Design, Automation and Test in Europe, Apr 2007, Nice, France. pp.528-533, 2007, 〈10.1109/DATE.2007.364647〉. 〈lirmm-00187037〉

Partager

Métriques

Consultations de la notice

174

Téléchargements de fichiers

289