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Academic Network for Microelectronic Test Education

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00195573
Contributor : Isabelle Gouat <>
Submitted on : Tuesday, December 11, 2007 - 11:10:44 AM
Last modification on : Monday, July 8, 2019 - 3:30:28 PM

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  • HAL Id : lirmm-00195573, version 1

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Franc Novak, Anton Biasizzo, Yves Bertrand, Marie-Lise Flottes, Luz Balado, et al.. Academic Network for Microelectronic Test Education. International Journal of Engineering Education, Tempus Publications, 2007, 23 (6), pp.1245-1253. ⟨lirmm-00195573⟩

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