On-Chip Monitor for the Detection of Logic Errors due to Simultaneous Switching Noise - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2008

On-Chip Monitor for the Detection of Logic Errors due to Simultaneous Switching Noise

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00260194

Submitted on : Monday, March 3, 2008-2:49:19 PM

Last modification on : Friday, March 24, 2023-2:52:49 PM

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lirmm-00260194 , version 1 (03-03-2008)

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  • HAL Id : lirmm-00260194 , version 1

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Florence Azaïs, Laurent Larguier, Yves Bertrand, Michel Renovell. On-Chip Monitor for the Detection of Logic Errors due to Simultaneous Switching Noise. LATW'08: 9th Latin-American Test Workshop, Puebla, Mexico, pp.11-16. ⟨lirmm-00260194⟩

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