On-Chip Monitor for the Detection of Logic Errors due to Simultaneous Switching Noise - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2008
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lirmm-00260194 , version 1 (03-03-2008)

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  • HAL Id : lirmm-00260194 , version 1

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Florence Azaïs, Laurent Larguier, Yves Bertrand, Michel Renovell. On-Chip Monitor for the Detection of Logic Errors due to Simultaneous Switching Noise. LATW'08: 9th Latin-American Test Workshop, Puebla, Mexico, pp.11-16. ⟨lirmm-00260194⟩
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