On-Chip Monitor for the Detection of Logic Errors due to Simultaneous Switching Noise

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00260194
Contributor : Martine Peridier <>
Submitted on : Monday, March 3, 2008 - 2:49:19 PM
Last modification on : Friday, July 20, 2018 - 12:34:01 PM

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  • HAL Id : lirmm-00260194, version 1

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Florence Azaïs, Laurent Larguier, Yves Bertrand, Michel Renovell. On-Chip Monitor for the Detection of Logic Errors due to Simultaneous Switching Noise. LATW'08: 9th Latin-American Test Workshop, Puebla, Mexico, pp.11-16. ⟨lirmm-00260194⟩

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