A high accuracy triangle-wave signal generator for on-chip ADC testing - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2002

A high accuracy triangle-wave signal generator for on-chip ADC testing

Abstract

A general BIST architecture for A-to-D converters involves the integration of both an analog test signal generator and a digital output response analyzer. This paper presents a structure for the internal generation of a linear signal used with the histogram-based test technique. The structure is based on two highly linear ramp generators together with a feedback control circuitry. Results show that the proposed structure preserves the linearity of the ramp generators while accuracy of the triangle-wave is provided by means of a calibration scheme.
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Dates and versions

lirmm-00268483 , version 1 (01-04-2008)

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Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell. A high accuracy triangle-wave signal generator for on-chip ADC testing. ETW 2002 - 7th IEEE European Test Workshop, May 2002, Corfu, Greece. pp.89-94, ⟨10.1109/ETW.2002.1029644⟩. ⟨lirmm-00268483⟩
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