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Conference Papers Year : 2002

Evaluation of the Oscillation-Based Test Methodology for Micro-Electro-Mechanical Systems

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lirmm-00268484 , version 1 (01-04-2008)

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  • HAL Id : lirmm-00268484 , version 1

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Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Evaluation of the Oscillation-Based Test Methodology for Micro-Electro-Mechanical Systems. VTS'02: 20th IEEE VLSI Test Symposium, Monterey, CA, USA, pp.439-444. ⟨lirmm-00268484⟩
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