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Evaluation of the Oscillation-Based Test Methodology for Micro-Electro-Mechanical Systems

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268484
Contributor : Christine Carvalho de Matos <>
Submitted on : Tuesday, April 1, 2008 - 9:27:29 AM
Last modification on : Wednesday, January 1, 2020 - 6:46:01 PM

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  • HAL Id : lirmm-00268484, version 1

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Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Evaluation of the Oscillation-Based Test Methodology for Micro-Electro-Mechanical Systems. VTS'02: 20th IEEE VLSI Test Symposium, Monterey, CA, USA, pp.439-444. ⟨lirmm-00268484⟩

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