Conference Papers
Year : 2002
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268499
Submitted on : Tuesday, April 1, 2008-9:27:33 AM
Last modification on : Thursday, April 4, 2024-9:28:28 PM
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- HAL Id : lirmm-00268499 , version 1
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René M. G. David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel. On Using Efficient Test Sequences for BIST. VTS: VLSI Test Symposium, 2002, Monterey, CA, United States. pp.145-150. ⟨lirmm-00268499⟩
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