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On Using Efficient Test Sequences for BIST

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268499
Contributor : Christine Carvalho de Matos <>
Submitted on : Tuesday, April 1, 2008 - 9:27:33 AM
Last modification on : Monday, July 27, 2020 - 2:37:12 PM

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  • HAL Id : lirmm-00268499, version 1

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René David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel. On Using Efficient Test Sequences for BIST. VTS: VLSI Test Symposium, 2002, Monterey, CA, United States. pp.145-150. ⟨lirmm-00268499⟩

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