On Using Efficient Test Sequences for BIST - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2002

On Using Efficient Test Sequences for BIST

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Micro and nanotechnologies/Microelectronics

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268499

Submitted on : Tuesday, April 1, 2008-9:27:33 AM

Last modification on : Thursday, April 4, 2024-9:28:28 PM

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lirmm-00268499 , version 1 (01-04-2008)

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  • HAL Id : lirmm-00268499 , version 1

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René M. G. David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel. On Using Efficient Test Sequences for BIST. VTS: VLSI Test Symposium, 2002, Monterey, CA, United States. pp.145-150. ⟨lirmm-00268499⟩

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