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Survey of Low-Power Testing of VLSI Circuits

Patrick Girard 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268584
Contributor : Christine Carvalho de Matos <>
Submitted on : Tuesday, April 1, 2008 - 9:27:54 AM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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  • HAL Id : lirmm-00268584, version 1

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Patrick Girard. Survey of Low-Power Testing of VLSI Circuits. IEEE Design & Test, IEEE, 2002, 19 (3), pp.82-92. ⟨lirmm-00268584⟩

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