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Journal Articles IEEE Design & Test Year : 2002

Survey of Low-Power Testing of VLSI Circuits

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lirmm-00268584 , version 1 (01-04-2008)

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Patrick Girard. Survey of Low-Power Testing of VLSI Circuits. IEEE Design & Test, 2002, 19 (3), pp.82-92. ⟨10.1109/MDT.2002.1003802⟩. ⟨lirmm-00268584⟩
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