Journal Articles
IEEE Design & Test
Year : 2002
Christine Carvalho De Matos : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268584
Submitted on : Tuesday, April 1, 2008-9:27:54 AM
Last modification on : Friday, March 24, 2023-2:52:50 PM
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Patrick Girard. Survey of Low-Power Testing of VLSI Circuits. IEEE Design & Test, 2002, 19 (3), pp.82-92. ⟨10.1109/MDT.2002.1003802⟩. ⟨lirmm-00268584⟩
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