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Non-Linear and Non-Split Transistor MOS Model for Gate Oxyde Short

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269333
Contributor : Christine Carvalho de Matos <>
Submitted on : Wednesday, April 2, 2008 - 4:46:02 PM
Last modification on : Friday, July 20, 2018 - 12:34:01 PM

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  • HAL Id : lirmm-00269333, version 1

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Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. Non-Linear and Non-Split Transistor MOS Model for Gate Oxyde Short. DBT: Defect Based Testing, Apr 2002, Monterey, CA, United States. pp.11-16. ⟨lirmm-00269333⟩

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