Design of an IEEE 1149.4 Test Chip with Extended ABM Functionality - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2002
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lirmm-00269340 , version 1 (02-04-2008)

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  • HAL Id : lirmm-00269340 , version 1

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Florence Azaïs, Pascal Nouet, Uroš Kač, Franc Novak. Design of an IEEE 1149.4 Test Chip with Extended ABM Functionality. IMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Montreux (Suisse), France. pp. 153-159. ⟨lirmm-00269340⟩
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