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Design of an IEEE 1149.4 Test Chip with Extended ABM Functionality

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269340
Contributor : Christine Carvalho de Matos <>
Submitted on : Wednesday, April 2, 2008 - 4:46:05 PM
Last modification on : Thursday, May 24, 2018 - 3:59:24 PM

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  • HAL Id : lirmm-00269340, version 1

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Florence Azaïs, Pascal Nouet, Uroš Kač, Franc Novak. Design of an IEEE 1149.4 Test Chip with Extended ABM Functionality. IMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Montreux (Suisse), France. pp. 153-159. ⟨lirmm-00269340⟩

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