Designing Testable Analog Filters with Optimal DFT Insertion - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2002

Designing Testable Analog Filters with Optimal DFT Insertion

Domains

Micro and nanotechnologies/Microelectronics

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269341

Submitted on : Wednesday, April 2, 2008-4:46:05 PM

Last modification on : Friday, March 24, 2023-2:52:50 PM

No file

Dates and versions

lirmm-00269341 , version 1 (02-04-2008)

Identifiers

  • HAL Id : lirmm-00269341 , version 1

Cite

Florence Azaïs, Yves Bertrand, Jose Vicente Calvano, Marcelo Lubaszewski, Pascal Nouet, et al.. Designing Testable Analog Filters with Optimal DFT Insertion. IMSTW: International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.201-203. ⟨lirmm-00269341⟩

Export

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

CNRS SYSMIC LIRMM LIRMM_MIC MIC MIPS UNIV-MONTPELLIER
59 View
0 Download

Share

Gmail Mastodon Facebook X LinkedIn More