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Conference Papers Year : 2003

Software-Based Testing of Sequential VHDL Descriptions

Mathieu Scholivé
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Vincent Beroulle
Chantal Robach
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Abstract

In this paper, we propose a new high-level test pattern generation technique for sequential circuits. The main motivation is two-fold: on one hand, we elaborate test data for design validation; on the other hand, we deal with the problem of structural test development at functional level. The proposed test method, i.e. mutation testing, allows us to work with a fault model at software level on VHDL descriptions; this approach has already shown its efficiency on combinational descriptions. In order to tackle the specific problem of sequential circuits, the description is modified so that the state variables are made observable and controllable.
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Dates and versions

lirmm-00269437 , version 1 (03-04-2008)

Identifiers

  • HAL Id : lirmm-00269437 , version 1

Cite

Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre. Software-Based Testing of Sequential VHDL Descriptions. 8th IEEE European Test Workshop (ETW), May 2003, Maastricht, Netherlands. pp.199-200. ⟨lirmm-00269437⟩
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