 |
HAL-LIRMM - Open Archive |  |
Conference papers
Software-Based Testing of Sequential VHDL Descriptions
Abstract : In this paper, we propose a new high-level test pattern generation technique for sequential circuits. The main motivation is two-fold: on one hand, we elaborate test data for design validation; on the other hand, we deal with the problem of structural test development at functional level. The proposed test method, i.e. mutation testing, allows us to work with a fault model at software level on VHDL descriptions; this approach has already shown its efficiency on combinational descriptions. In order to tackle the specific problem of sequential circuits, the description is modified so that the state variables are made observable and controllable.
Cited literature [2 references]
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269437
Contributor : Christine Carvalho de Matos <>
Submitted on : Thursday, April 3, 2008 - 8:11:56 AM
Last modification on : Friday, December 18, 2020 - 3:39:38 AM
Long-term archiving on: : Thursday, May 20, 2010 - 10:52:00 PM
Contributor : Christine Carvalho de Matos <>
Submitted on : Thursday, April 3, 2008 - 8:11:56 AM
Last modification on : Friday, December 18, 2020 - 3:39:38 AM
Long-term archiving on: : Thursday, May 20, 2010 - 10:52:00 PM
File
D142.PDF
Files produced by the author(s)