Abstract : In this paper, we propose a new high-level test pattern generation technique for sequential circuits. The main motivation is two-fold: on one hand, we elaborate test data for design validation; on the other hand, we deal with the problem of structural test development at functional level. The proposed test method, i.e. mutation testing, allows us to work with a fault model at software level on VHDL descriptions; this approach has already shown its efficiency on combinational descriptions. In order to tackle the specific problem of sequential circuits, the description is modified so that the state variables are made observable and controllable.
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269437
Contributeur : Christine Carvalho de Matos
<>
Soumis le : jeudi 3 avril 2008 - 08:11:56
Dernière modification le : mercredi 13 mars 2019 - 16:44:02
Document(s) archivé(s) le : jeudi 20 mai 2010 - 22:52:00
Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre. Software-Based Testing of Sequential VHDL Descriptions. ETW: European Test Workshop, Mar 2003, Maastricht, Netherlands. pp.199-200, 2003. 〈lirmm-00269437〉
