Journal Articles
Journal of Electronic Testing: : Theory and Applications
Year : 2003
Christine Carvalho De Matos : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269602
Submitted on : Thursday, April 3, 2008-8:21:57 AM
Last modification on : Friday, March 24, 2023-2:52:50 PM
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Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell. On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST. Journal of Electronic Testing: : Theory and Applications, 2003, 19 (4), pp. 469-479. ⟨10.1023/A:1024652328578⟩. ⟨lirmm-00269602⟩
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