On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Journal Articles Journal of Electronic Testing: : Theory and Applications Year : 2003

On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST

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Computer Science [cs]

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269602

Submitted on : Thursday, April 3, 2008-8:21:57 AM

Last modification on : Friday, March 24, 2023-2:52:50 PM

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lirmm-00269602 , version 1 (03-04-2008)

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Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell. On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST. Journal of Electronic Testing: : Theory and Applications, 2003, 19 (4), pp. 469-479. ⟨10.1023/A:1024652328578⟩. ⟨lirmm-00269602⟩

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