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Conference papers

Delay Testing of MOS Transistor with Gate Oxide Short

Michel Renovell 1 Jean-Marc J.-M. Galliere 1 Florence Azaïs 1 Yves Bertrand 1 
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269641
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Submitted on : Thursday, April 3, 2008 - 8:22:05 AM
Last modification on : Tuesday, September 6, 2022 - 4:56:47 PM

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  • HAL Id : lirmm-00269641, version 1

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Michel Renovell, Jean-Marc J.-M. Galliere, Florence Azaïs, Yves Bertrand. Delay Testing of MOS Transistor with Gate Oxide Short. ATS: Asian Test Symposium, Nov 2003, Xian, China. pp.168-173. ⟨lirmm-00269641⟩

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