Skip to Main content Skip to Navigation
Conference papers

Delay Testing of MOS Transistor with Gate Oxide Short

Michel Renovell 1 Jean-Marc Galliere 1 Florence Azaïs 1 Yves Bertrand 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Document type :
Conference papers
Complete list of metadata

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269641
Contributor : Christine Carvalho de Matos <>
Submitted on : Thursday, April 3, 2008 - 8:22:05 AM
Last modification on : Wednesday, December 2, 2020 - 9:40:09 AM

Identifiers

  • HAL Id : lirmm-00269641, version 1

Collections

Citation

Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. Delay Testing of MOS Transistor with Gate Oxide Short. ATS: Asian Test Symposium, Nov 2003, Xian, China. pp.168-173. ⟨lirmm-00269641⟩

Share

Metrics

Record views

116