13th IEEE European Test Symposium (ETS'08) - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Books Year : 2008

13th IEEE European Test Symposium (ETS'08)

Keywords

Test

Domains

Micro and nanotechnologies/Microelectronics

Patrick Girard  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00326806

Submitted on : Monday, October 6, 2008-9:24:47 AM

Last modification on : Monday, November 27, 2023-2:26:05 PM

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lirmm-00326806 , version 1 (06-10-2008)

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  • HAL Id : lirmm-00326806 , version 1

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Patrick Girard, Matteo Sonza Reorda, Zebo Peng, Christian Landrault, Cecilia Metra (Dir.). 13th IEEE European Test Symposium (ETS'08). IEEE Computer Society, pp.250, 2008, 978-0-7695-3150-2. ⟨lirmm-00326806⟩

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CNRS SYSMIC LIRMM LIRMM_MIC MIC MIPS UNIV-MONTPELLIER
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