13th IEEE European Test Symposium (ETS'08) - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Books Year : 2008

13th IEEE European Test Symposium (ETS'08)

Keywords

Test

Domains

Micro and nanotechnologies/Microelectronics

Patrick Girard  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00326806

Submitted on : Monday, October 6, 2008-9:24:47 AM

Last modification on : Thursday, December 14, 2023-1:56:06 PM

No file

Dates and versions

lirmm-00326806 , version 1 (06-10-2008)

Identifiers

  • HAL Id : lirmm-00326806 , version 1

Cite

Patrick Girard, Matteo Sonza Reorda, Zebo Peng, Christian Landrault, Cecilia Metra (Dir.). 13th IEEE European Test Symposium (ETS'08). IEEE Computer Society, pp.250, 2008, 978-0-7695-3150-2. ⟨lirmm-00326806⟩

Export

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

CNRS SYSMIC LIRMM LIRMM_MIC MIC MIPS UNIV-MONTPELLIER
88 View
0 Download

Share

Gmail Mastodon Facebook X LinkedIn More