A Physics-Based Compact Model for ESD Protection Diodes under Very Fast Transients

Abstract : In this paper, a complete analysis of the physical phenomena occurring in ESD protection diodes during very fast transients is investigated. Thanks to TCAD simulations and transient characterization, it is highlighted that the mobility degradation effect must be taken into account in addition to the conductivity modulation effect for modeling diode behavior during triggering. Finally, a new physics-based compact model of ESD protection diodes is proposed, demonstrated and validated under very fast transient events in the CDM time domain.
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Communication dans un congrès
30th Annual EOS/ESD Symposium, Sep 2008, Tuscon, Arizona, USA, pp.9, 2008
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00337880
Contributeur : Florence Azais <>
Soumis le : lundi 10 novembre 2008 - 09:52:52
Dernière modification le : jeudi 11 janvier 2018 - 06:27:19

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  • HAL Id : lirmm-00337880, version 1

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Jean-Robert Manouvrier, Pascal Fonteneau, Charles-Alexandre Legrand, Hélène Beckrich-Ros, Corinne Richier, et al.. A Physics-Based Compact Model for ESD Protection Diodes under Very Fast Transients. 30th Annual EOS/ESD Symposium, Sep 2008, Tuscon, Arizona, USA, pp.9, 2008. 〈lirmm-00337880〉

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