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Test and Harware Security

Marion Doulcier 1 Giorgio Di Natale 2 Marie-Lise Flottes 2 Bruno Rouzeyre 2
1 LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : This talk higlights the conflicting goal of harware security and harware testing. Some scan and BIST solutions are presented.
Keywords : Hardware security
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00365276
Contributor : Bruno Rouzeyre Connect in order to contact the contributor
Submitted on : Monday, March 2, 2009 - 6:27:06 PM
Last modification on : Thursday, March 31, 2022 - 11:02:32 AM
Long-term archiving on: : Tuesday, June 8, 2010 - 7:57:41 PM

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  • HAL Id : lirmm-00365276, version 1

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CNRS | SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER | AXESECULIRMM

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Marion Doulcier, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Test and Harware Security. 2008. ⟨lirmm-00365276⟩

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