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Other Publications Year : 2008

Test and Harware Security

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Abstract

This talk higlights the conflicting goal of harware security and harware testing. Some scan and BIST solutions are presented.

Keywords

Hardware security

Domains

Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics
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Bruno Rouzeyre  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00365276

Submitted on : Monday, March 2, 2009-6:27:06 PM

Last modification on : Wednesday, February 8, 2023-5:10:47 PM

Long-term archiving on: Tuesday, June 8, 2010-7:57:41 PM

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Dates and versions

lirmm-00365276 , version 1 (02-03-2009)

Identifiers

  • HAL Id : lirmm-00365276 , version 1

Cite

Marion Doulcier, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Test and Harware Security. 2008. ⟨lirmm-00365276⟩

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CNRS SYSMIC LIRMM LIRMM_MIC MIC MIPS UNIV-MONTPELLIER AXESECULIRMM
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