Test and Harware Security - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Other Publications Year : 2008

Test and Harware Security

Abstract

This talk higlights the conflicting goal of harware security and harware testing. Some scan and BIST solutions are presented.

Keywords

Hardware security

Domains

Micro and nanotechnologies/Microelectronics
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Bruno Rouzeyre  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00365276

Submitted on : Monday, March 2, 2009-6:27:06 PM

Last modification on : Friday, March 24, 2023-2:52:51 PM

Long-term archiving on : Tuesday, June 8, 2010-7:57:41 PM

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Dates and versions

lirmm-00365276 , version 1 (02-03-2009)

Identifiers

  • HAL Id : lirmm-00365276 , version 1

Cite

Marion Doulcier, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Test and Harware Security. 2008. ⟨lirmm-00365276⟩

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CNRS SYSMIC LIRMM LIRMM_MIC MIC MIPS UNIV-MONTPELLIER AXESECULIRMM
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