Something I Always Wanted to Know About Test, But Was Afraid to Ask

Christian Landrault 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : As pinpointed in the last ITRS report and also clearly highlighted in the past years test conference programs, the overall mission of manufacturing test is continuously shifting from its "screening defects" basic and primary objective towards more subtle and secondary goals constituted for example by reliability aspect and yield learning. Just after his retirement, the author examines these new testing opportunity and will try to give directions to all what he missed and failed to do in his research carrier.
Type de document :
Communication dans un congrès
Cecilia Metra; Paulo Teixeira; Jose-Luis Huertas. ETS: European Test Symposium, May 2009, Séville, Spain. 14th IEEE European Test Symposium, 2009, 〈http://www.imse.cnm.es/ets09/〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00370358
Contributeur : Christian Landrault <>
Soumis le : mardi 24 mars 2009 - 11:07:53
Dernière modification le : jeudi 24 mai 2018 - 15:59:24

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  • HAL Id : lirmm-00370358, version 1

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Christian Landrault. Something I Always Wanted to Know About Test, But Was Afraid to Ask. Cecilia Metra; Paulo Teixeira; Jose-Luis Huertas. ETS: European Test Symposium, May 2009, Séville, Spain. 14th IEEE European Test Symposium, 2009, 〈http://www.imse.cnm.es/ets09/〉. 〈lirmm-00370358〉

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