Power-Aware Testing and Test Strategies for Low Power Devices

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00371356
Contributor : Martine Peridier <>
Submitted on : Friday, March 27, 2009 - 3:25:02 PM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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  • HAL Id : lirmm-00371356, version 1

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Patrick Girard, Nicolas Nicolici, Xiaoqing Wen. Power-Aware Testing and Test Strategies for Low Power Devices. Springer, pp.353, 2010. ⟨lirmm-00371356⟩

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