Power-Aware Testing and Test Strategies for Low Power Devices - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Books Year : 2010
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lirmm-00371356 , version 1 (27-03-2009)

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  • HAL Id : lirmm-00371356 , version 1

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Patrick Girard, Nicolas Nicolici, Xiaoqing Wen. Power-Aware Testing and Test Strategies for Low Power Devices. Springer, pp.353, 2010. ⟨lirmm-00371356⟩
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