Books
Year : 2010
Martine Peridier : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00371356
Submitted on : Friday, March 27, 2009-3:25:02 PM
Last modification on : Tuesday, September 17, 2024-10:16:17 AM
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- HAL Id : lirmm-00371356 , version 1
Cite
Patrick Girard, Nicolas Nicolici, Xiaoqing Wen. Power-Aware Testing and Test Strategies for Low Power Devices. Springer, pp.353, 2010. ⟨lirmm-00371356⟩
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