Power-Aware Testing and Test Strategies for Low Power Devices - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Books Year : 2010

Power-Aware Testing and Test Strategies for Low Power Devices

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00371356

Submitted on : Friday, March 27, 2009-3:25:02 PM

Last modification on : Friday, March 24, 2023-2:52:51 PM

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lirmm-00371356 , version 1 (27-03-2009)

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  • HAL Id : lirmm-00371356 , version 1

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Patrick Girard, Nicolas Nicolici, Xiaoqing Wen. Power-Aware Testing and Test Strategies for Low Power Devices. Springer, pp.353, 2010. ⟨lirmm-00371356⟩

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