Skip to Main content Skip to Navigation
Journal articles

Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behaviour Prediction in eFlash

Complete list of metadata

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00371370
Contributor : Martine Peridier <>
Submitted on : Friday, March 27, 2009 - 3:50:21 PM
Last modification on : Friday, November 27, 2020 - 6:04:03 PM

Identifiers

  • HAL Id : lirmm-00371370, version 1

Collections

Citation

Olivier Ginez, Jean-Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, et al.. Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behaviour Prediction in eFlash. Journal of Electronic Testing, Springer Verlag, 2009, N/A, pp.127-144. ⟨lirmm-00371370⟩

Share

Metrics

Record views

160