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Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behaviour Prediction in eFlash

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00371370
Contributor : Martine Peridier <>
Submitted on : Friday, March 27, 2009 - 3:50:21 PM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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  • HAL Id : lirmm-00371370, version 1

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Olivier Ginez, Jean-Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, et al.. Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behaviour Prediction in eFlash. Journal of Electronic Testing, Springer Verlag, 2009, N/A, pp.127-144. ⟨lirmm-00371370⟩

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