A New Design-for-Test Technique for SRAM Core-Cell Stability Faults - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2009

A New Design-for-Test Technique for SRAM Core-Cell Stability Faults

Abstract

Core-cell stability represents the ability of the core-cell to keep the stored data. With the rapid development of semiconductor memories, their test is becoming a major concern in VDSM technologies. It provides information about the SRAM design reliability, and its effectiveness is therefore mandatory for safety applications. Existing core-cell stability design-for-test (DfT) techniques consist in controlling the voltage levels of bit lines to apply a weak write stress on the core-cell under test. If the core-cell is weak, the weak write stress induces the faulty swap of the core-cell. However, these solutions are costly in terms of area and test application time, and generally require modifications of critical parts of the SRAM (core-cell array and/or the structure generating the internal auto-timing). In this paper, we present a new DfT technique for stability fault detection. It consists in modulating the word line activation in order to perform an adjustable weak write stress on the targeted core-cell for stability fault detection. Compared to existing DfT solutions, the proposed technique offers many advantages: programmability, low area overhead, low test application time. Moreover, it does not require any modification of critical parts of the SRAM.
Fichier principal
Vignette du fichier
05090873.pdf (482.74 Ko) Télécharger le fichier
Origin : Publisher files allowed on an open archive
Loading...

Dates and versions

lirmm-00371374 , version 1 (06-10-2019)

Identifiers

Cite

Alexandre Ney, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, et al.. A New Design-for-Test Technique for SRAM Core-Cell Stability Faults. DATE: Design, Automation and Test in Europe, Apr 2009, Nice, France. pp.1344-1348, ⟨10.1109/DATE.2009.5090873⟩. ⟨lirmm-00371374⟩
99 View
164 Download

Altmetric

Share

Gmail Facebook X LinkedIn More