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Assessment of the Immunity of Unshielded Multicore Integrated Circuits to Near Field Injection

Abstract : This paper presents a comparative assessment of the electromagnetic immunity of 4 integrated logic cores to near-field injection. These cores, located on the same die, are identical from a functional point of view, but differ by their design strategies. The injection is performed above each core according to the 6 components of the electromagnetic field, using appropriate probes. These results demonstrate that the die and bondwires of an integrated circuit can be sensitive to both magnetic and electric fields, and that some design rules can improve the immunity of integrated circuits to near-field interference.
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00394411
Contributor : Philippe Maurine <>
Submitted on : Thursday, June 11, 2009 - 3:26:48 PM
Last modification on : Wednesday, April 8, 2020 - 3:56:18 PM
Long-term archiving on: : Monday, October 15, 2012 - 12:20:17 PM

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  • HAL Id : lirmm-00394411, version 1

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Ali Alaeldine, Thomas Ordas, Richard Perdriau, Philippe Maurine, Mohamed Ramdani, et al.. Assessment of the Immunity of Unshielded Multicore Integrated Circuits to Near Field Injection. International Zurich Symposium on Electromagnetic Compatibility, France. pp.361-364. ⟨lirmm-00394411⟩

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