Challenges in Manufacturing Test of Micro and Nano-Systems - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2005

Challenges in Manufacturing Test of Micro and Nano-Systems

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lirmm-00406781 , version 1 (23-07-2009)

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  • HAL Id : lirmm-00406781 , version 1

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Pascal Nouet. Challenges in Manufacturing Test of Micro and Nano-Systems. The Innovative Manufacturing Research Conference, Scottish Manufacturing Institute, France. ⟨lirmm-00406781⟩
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