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Conference papers

Challenges in Manufacturing Test of Micro and Nano-Systems

Pascal Nouet 1 
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00406837
Contributor : Lionel Torres Connect in order to contact the contributor
Submitted on : Thursday, July 23, 2009 - 3:47:27 PM
Last modification on : Friday, August 5, 2022 - 10:47:54 AM

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  • HAL Id : lirmm-00406837, version 1

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CNRS | SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER

Citation

Pascal Nouet. Challenges in Manufacturing Test of Micro and Nano-Systems. Workshop on Design for Reliability and Manufacturability in MNT, France. ⟨lirmm-00406837⟩

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