Challenges in Manufacturing Test of Micro and Nano-Systems - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2006

Challenges in Manufacturing Test of Micro and Nano-Systems

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lirmm-00406837 , version 1 (23-07-2009)

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  • HAL Id : lirmm-00406837 , version 1

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Pascal Nouet. Challenges in Manufacturing Test of Micro and Nano-Systems. Workshop on Design for Reliability and Manufacturability in MNT, France. ⟨lirmm-00406837⟩
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