Challenges in Manufacturing Test of Micro and Nano-Systems

Pascal Nouet 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Document type :
Conference papers
Complete list of metadatas
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00406837
Contributor : Lionel Torres <>
Submitted on : Thursday, July 23, 2009 - 3:47:27 PM
Last modification on : Thursday, May 24, 2018 - 3:59:24 PM

Identifiers

  • HAL Id : lirmm-00406837, version 1

Collections

CNRS | SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER

Citation

Pascal Nouet. Challenges in Manufacturing Test of Micro and Nano-Systems. Workshop on Design for Reliability and Manufacturability in MNT, France. ⟨lirmm-00406837⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

34

Contact

Informations

CCSD