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CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing

Abstract : At-speed scan testing is susceptible to yield loss risk due to power supply noise caused by excessive launch switching activity. This paper proposes a novel two-stage scheme, namely CTX (Clock-Gating-Based Test Relaxation and X-Filling), for reducing switching activity when test stimulus is launched. Test relaxation and X-filling are conducted (1) to make as many FFs inactive as possible by disabling corresponding clock-control signals of clock-gating circuitry in Stage-1 (Clock-Disabling), and (2) to make as many remaining active FFs as possible to have equal input and output values in Stage-2 (FF-Silencing). CTX effectively reduces launch switching activity, thus yield loss risk, even with a small number of donpsilat care (X) bits as in test compression, without any impact on test data volume, fault coverage, performance, and circuit design.
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00406971
Contributor : Lionel Torres <>
Submitted on : Thursday, July 23, 2009 - 5:36:01 PM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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Hiroshi Furukawa, Xiaoqing Wen, Kohei Miyase, Yuta Yamato, Seiji Kajihara, et al.. CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing. ATS: Asian Test Symposium, Nov 2008, Sapporo, Japan. pp.297-302, ⟨10.1109/ATS.2008.27⟩. ⟨lirmm-00406971⟩

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