CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing

Abstract : At-speed scan testing is susceptible to yield loss risk due to power supply noise caused by excessive launch switching activity. This paper proposes a novel two-stage scheme, namely CTX (Clock-Gating-Based Test Relaxation and X-Filling), for reducing switching activity when test stimulus is launched. Test relaxation and X-filling are conducted (1) to make as many FFs inactive as possible by disabling corresponding clock-control signals of clock-gating circuitry in Stage-1 (Clock-Disabling), and (2) to make as many remaining active FFs as possible to have equal input and output values in Stage-2 (FF-Silencing). CTX effectively reduces launch switching activity, thus yield loss risk, even with a small number of donpsilat care (X) bits as in test compression, without any impact on test data volume, fault coverage, performance, and circuit design.
Type de document :
Communication dans un congrès
ATS: Asian Test Symposium, Nov 2008, Sapporo, Japan. 17th IEEE Asian Test Symposium, pp.297-302, 2008, 〈10.1109/ATS.2008.27〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00406971
Contributeur : Lionel Torres <>
Soumis le : jeudi 23 juillet 2009 - 17:36:01
Dernière modification le : jeudi 11 janvier 2018 - 02:08:11

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Hiroshi Furukawa, Xiaoqing Wen, Kohei Miyase, Yuta Yamato, Seiji Kajihara, et al.. CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing. ATS: Asian Test Symposium, Nov 2008, Sapporo, Japan. 17th IEEE Asian Test Symposium, pp.297-302, 2008, 〈10.1109/ATS.2008.27〉. 〈lirmm-00406971〉

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