Conference Papers
Year : 2008
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00407023
Submitted on : Thursday, July 23, 2009-6:03:08 PM
Last modification on : Friday, March 24, 2023-2:52:52 PM
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- HAL Id : lirmm-00407023 , version 1
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Serge Bernard, J.N. Palazin, Philippe Cauvet. Testing electronic chips: Innovation for multimedia, automotive and healthcare application. Presentation from NXP and ISyTest at the European research & Innovation exhibition, Paris, France. ⟨lirmm-00407023⟩
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