Trade-off Between Power Dissipation and Delay Fault Coverage for LOS and LOC Testing Schemes - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Poster Year : 2009

Trade-off Between Power Dissipation and Delay Fault Coverage for LOS and LOC Testing Schemes

Abstract

Power dissipation and delay fault coverage have always been a trade-off that becomes an actual issue for at-speed test scheme. In this paper, we list the sources of power dissipation and delay fault models that may affect circuits. After, we propose a comparison between two different at- speed scan testing schemes, namely Launch-Off-Shift (LOS) and Launch-Off-Capture (LOC). For this purpose, we operate a formal characterization of the two scan test schemes through their application in benchmark circuits.
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Dates and versions

lirmm-00434959 , version 1 (23-11-2009)

Identifiers

  • HAL Id : lirmm-00434959 , version 1

Cite

Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Trade-off Between Power Dissipation and Delay Fault Coverage for LOS and LOC Testing Schemes. GDR SOC SIP, France. 2009. ⟨lirmm-00434959⟩
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