Trade-off Between Power Dissipation and Delay Fault Coverage for LOS and LOC Testing Schemes

Abstract : Power dissipation and delay fault coverage have always been a trade-off that becomes an actual issue for at-speed test scheme. In this paper, we list the sources of power dissipation and delay fault models that may affect circuits. After, we propose a comparison between two different at- speed scan testing schemes, namely Launch-Off-Shift (LOS) and Launch-Off-Capture (LOC). For this purpose, we operate a formal characterization of the two scan test schemes through their application in benchmark circuits.
Type de document :
Poster
GDR SOC SIP, France. 2009
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00434959
Contributeur : Arnaud Virazel <>
Soumis le : lundi 23 novembre 2009 - 14:48:14
Dernière modification le : jeudi 11 janvier 2018 - 06:27:19

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  • HAL Id : lirmm-00434959, version 1

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Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Trade-off Between Power Dissipation and Delay Fault Coverage for LOS and LOC Testing Schemes. GDR SOC SIP, France. 2009. 〈lirmm-00434959〉

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