A Multi-Converter DFT Technique for Complex SIP: Concepts and Validation

This paper presents a new technique called “Analog Network of Converters” that allows to test a set of ADCs and DACs embedded in a complex circuit as SiP and SoC. It presents an experimental validation of this new concept that permits to reduce drastically the testing time and requires only a low cost digital ATE.

Keywords

Mixed-signal testing DFT ADC DAC

Domains

Micro and nanotechnologies/Microelectronics

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Spec-Session-comte.pdf (165.59 Ko)

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00448863

Submitted on : Wednesday, January 20, 2010-12:05:25 PM

Last modification on : Friday, March 24, 2023-2:52:52 PM

Long-term archiving on: Friday, June 18, 2010-1:09:39 AM

Dates and versions

lirmm-00448863 , version 1 (20-01-2010)

Identifiers

HAL Id : lirmm-00448863 , version 1

Cite

Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, et al.. A Multi-Converter DFT Technique for Complex SIP: Concepts and Validation. ECCTD: European Conference on Circuit Theory and Design, Aug 2009, Antalya, Turkey. pp.747-750. ⟨lirmm-00448863⟩

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