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Conference papers
A Multi-Converter DFT Technique for Complex SIP: Concepts and Validation
Abstract : This paper presents a new technique called “Analog Network of Converters” that allows to test a set of ADCs and DACs embedded in a complex circuit as SiP and SoC. It presents an experimental validation of this new concept that permits to reduce drastically the testing time and requires only a low cost digital ATE.
Cited literature [11 references]
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00448863
Contributor : Mariane Comte Connect in order to contact the contributor
Submitted on : Wednesday, January 20, 2010 - 12:05:25 PM
Last modification on : Friday, August 5, 2022 - 10:48:05 AM
Long-term archiving on: : Friday, June 18, 2010 - 1:09:39 AM
Contributor : Mariane Comte Connect in order to contact the contributor
Submitted on : Wednesday, January 20, 2010 - 12:05:25 PM
Last modification on : Friday, August 5, 2022 - 10:48:05 AM
Long-term archiving on: : Friday, June 18, 2010 - 1:09:39 AM
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Spec-Session-comte.pdf
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