https://hal-lirmm.ccsd.cnrs.fr/lirmm-00480710
Contributor : Martine Peridier
<>
Submitted on : Tuesday, May 4, 2010 - 5:30:27 PM
Last modification on : Thursday, January 24, 2019 - 9:46:03 AM
Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Ensuring High Testability without Degrading Security. DDECS'10: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Vienna, Austria. pp.6. ⟨lirmm-00480710⟩
