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Conference papers

Ensuring High Testability without Degrading Security

Giorgio Di Natale 1 Marie-Lise Flottes 1 Bruno Rouzeyre 1 
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00480710
Contributor : Martine Peridier Connect in order to contact the contributor
Submitted on : Tuesday, May 4, 2010 - 5:30:27 PM
Last modification on : Friday, August 5, 2022 - 10:48:01 AM

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  • HAL Id : lirmm-00480710, version 1

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CNRS | SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER

Citation

Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Ensuring High Testability without Degrading Security. DDECS'10: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Vienna, Austria. pp.6. ⟨lirmm-00480710⟩

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