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Conference Papers Year : 2010

Test and Dependability of Microsystems


For more than 30 years, the electronics industry has been driven by the development and the exploitation of the permanent shrink in the fabrication processes such as CMOS technologies (nanotechnologies, “More Moore”...). The next steps requiring huge investments, only a few European companies will be able to compete with majors worldwide. But this monolithic approach cannot meet one of the main market needs: more functions in a same chip. Indeed, only the use of heterogeneous technologies (Analog, RF, MEMS) in a single chip is suitable. Fortunately, the micro-systems (SiP, “More than Moore”) approach is now adopted, which permits to propose new solutions and new applications at reasonable costs. In this tutorial, we will at first give an overview of the existing and emerging technologies of micro-systems, illustrated by some typical examples. Although promising, we will subsequently list the major challenges posed by the technologies, from both technical and economical perspectives. Testing being one of the biggest challenges, in a third part, after the IC test techniques will have been reminded, a non-exhaustive list of solutions will be given with illustrations: SiP Test Access Port, loopback test, non-contact test, etc. Before concluding, the presenters will introduce the concept of dependability. Why and in which cases is it important? How can it be reached using test resources?
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lirmm-00506495 , version 1 (28-07-2010)


  • HAL Id : lirmm-00506495 , version 1


Serge Bernard, Philippe Cauvet. Test and Dependability of Microsystems. DTC'10: European Nanoelectronics Design Technology Conference, Jun 2010, grenoble, France. pp.210-216. ⟨lirmm-00506495⟩
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