A Roaming Memory Test Bench for Detecting Particle Induced SEUs - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Poster Year : 2010

A Roaming Memory Test Bench for Detecting Particle Induced SEUs

Abstract

In this paper, we propose a memory based test bench able to record soft errors that may occur to modern circuits in a certain environment. This system allows a good flexibility from different points of view. It is conceived to be modular, programmable, low power consuming and portable. Consequently, it can operate in various experimental conditions such as under artificial sources of particles as well as in natural ambience, from the earth surface to spatial environment.
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Dates and versions

lirmm-00537879 , version 1 (19-11-2010)

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Jean-Marc J.-M. Galliere, Paolo Rech, Patrick Girard, Luigi Dilillo. A Roaming Memory Test Bench for Detecting Particle Induced SEUs. ITC 2010 - International Test Conference, Nov 2010, Austin, TX, United States. 2010, ⟨10.1109/TEST.2010.5699302⟩. ⟨lirmm-00537879⟩
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