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Impact of Resistive-Bridging Defects in SRAM Core-Cell

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00553592
Contributor : Martine Peridier Connect in order to contact the contributor
Submitted on : Friday, January 7, 2011 - 4:11:37 PM
Last modification on : Friday, August 5, 2022 - 10:48:00 AM

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  • HAL Id : lirmm-00553592, version 1

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Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Impact of Resistive-Bridging Defects in SRAM Core-Cell. DELTA'10: International Symposium on Electronic Design, Test & Applications, Ho Chi Minh, Vietnam. pp.265-270. ⟨lirmm-00553592⟩

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