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Conference Papers Year : 2010

Detecting NBTI Induced Failures in SRAM Core-Cells

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lirmm-00553612 , version 1 (07-01-2011)

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  • HAL Id : lirmm-00553612 , version 1

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Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Detecting NBTI Induced Failures in SRAM Core-Cells. VTS'10: VLSI Test Symposium, Santa Cruz, CA, United States. pp.75-80. ⟨lirmm-00553612⟩
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