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Detecting NBTI Induced Failures in SRAM Core-Cells

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00553612
Contributor : Martine Peridier <>
Submitted on : Friday, January 7, 2011 - 4:31:32 PM
Last modification on : Friday, November 27, 2020 - 6:04:03 PM

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  • HAL Id : lirmm-00553612, version 1

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Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Detecting NBTI Induced Failures in SRAM Core-Cells. VTS'10: VLSI Test Symposium, Santa Cruz, CA, United States. pp.75-80. ⟨lirmm-00553612⟩

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