Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2010

Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00553930

Submitted on : Monday, January 10, 2011-11:29:59 AM

Last modification on : Tuesday, October 15, 2024-3:03:32 PM

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lirmm-00553930 , version 1 (10-01-2011)

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  • HAL Id : lirmm-00553930 , version 1

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Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing. LPonTR: 
Impact of Low-Power design on Test and Reliability, May 2010, Prague, Czech Republic. ⟨lirmm-00553930⟩

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