Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing

Type de document :
Communication dans un congrès
LPonTR: 
Impact of Low-Power design on Test and Reliability, May 2010, Prague, Czech Republic. 3rd International Workshop on 
Impact of Low-Power design on Test and Reliability, 2010, 〈https://www.staff.ncl.ac.uk/a.bystrov/LPonTR/2010/LPonTR-10-CfP.pdf〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00553930
Contributeur : Martine Peridier <>
Soumis le : lundi 10 janvier 2011 - 11:29:59
Dernière modification le : vendredi 2 mars 2018 - 19:36:02

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  • HAL Id : lirmm-00553930, version 1

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Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing. LPonTR: 
Impact of Low-Power design on Test and Reliability, May 2010, Prague, Czech Republic. 3rd International Workshop on 
Impact of Low-Power design on Test and Reliability, 2010, 〈https://www.staff.ncl.ac.uk/a.bystrov/LPonTR/2010/LPonTR-10-CfP.pdf〉. 〈lirmm-00553930〉

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