Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2010

Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing

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lirmm-00553930 , version 1 (10-01-2011)

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  • HAL Id : lirmm-00553930 , version 1

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Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing. LPonTR: 
Impact of Low-Power design on Test and Reliability, May 2010, Prague, Czech Republic. ⟨lirmm-00553930⟩
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