Skip to Main content Skip to Navigation
Conference papers

Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing

Complete list of metadatas

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00553930
Contributor : Martine Peridier <>
Submitted on : Monday, January 10, 2011 - 11:29:59 AM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

Identifiers

  • HAL Id : lirmm-00553930, version 1

Collections

Citation

Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing. LPonTR: 
Impact of Low-Power design on Test and Reliability, May 2010, Prague, Czech Republic. ⟨lirmm-00553930⟩

Share

Metrics

Record views

212