Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2010

Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00566847

Submitted on : Thursday, February 17, 2011-11:21:10 AM

Last modification on : Friday, March 24, 2023-2:52:54 PM

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lirmm-00566847 , version 1 (17-02-2011)

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  • HAL Id : lirmm-00566847 , version 1

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Paolo Rech, Jean-Marc J.-M. Galliere, Patrick Girard, Frédéric Wrobel, Frédéric Saigné, et al.. Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria. ⟨lirmm-00566847⟩

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