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Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00566847
Contributor : Martine Peridier <>
Submitted on : Thursday, February 17, 2011 - 11:21:10 AM
Last modification on : Thursday, January 23, 2020 - 4:28:09 PM

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  • HAL Id : lirmm-00566847, version 1

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Paolo Rech, Jean-Marc Galliere, Patrick Girard, Frédéric Wrobel, Frédéric Saigné, et al.. Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria. ⟨lirmm-00566847⟩

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