Mapping Test Power to Functional Power through Smart X-Filling for LOS Scheme - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2011

Mapping Test Power to Functional Power through Smart X-Filling for LOS Scheme

No file

Dates and versions

lirmm-00651905 , version 1 (14-12-2011)

Identifiers

  • HAL Id : lirmm-00651905 , version 1

Cite

Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Mapping Test Power to Functional Power through Smart X-Filling for LOS Scheme. LPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Trondheim, Norway. ⟨lirmm-00651905⟩
115 View
0 Download

Share

Gmail Mastodon Facebook X LinkedIn More