Mapping Test Power to Functional Power through Smart X-Filling for LOS Scheme - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2011

Mapping Test Power to Functional Power through Smart X-Filling for LOS Scheme

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00651905

Submitted on : Wednesday, December 14, 2011-2:50:30 PM

Last modification on : Friday, March 24, 2023-2:52:55 PM

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lirmm-00651905 , version 1 (14-12-2011)

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  • HAL Id : lirmm-00651905 , version 1

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Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Mapping Test Power to Functional Power through Smart X-Filling for LOS Scheme. LPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Trondheim, Norway. ⟨lirmm-00651905⟩

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