Mapping Test Power to Functional Power through Smart X-Filling for LOS Scheme

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00651905
Contributor : Martine Peridier <>
Submitted on : Wednesday, December 14, 2011 - 2:50:30 PM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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  • HAL Id : lirmm-00651905, version 1

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Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Mapping Test Power to Functional Power through Smart X-Filling for LOS Scheme. LPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Trondheim, Norway. ⟨lirmm-00651905⟩

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