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Conference Papers Year : 2011

Robustness Improvement of Digital Circuits A New Hybrid Fault Tolerant Architecture

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lirmm-00679509 , version 1 (15-03-2012)

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  • HAL Id : lirmm-00679509 , version 1

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Ahn Duc Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Robustness Improvement of Digital Circuits A New Hybrid Fault Tolerant Architecture. JNRDM'11: Journées Nationales du Réseau Doctoral de Microélectronique, Paris, France. ⟨lirmm-00679509⟩
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