Robustness Improvement of Digital Circuits A New Hybrid Fault Tolerant Architecture

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00679509
Contributor : Martine Peridier <>
Submitted on : Thursday, March 15, 2012 - 5:22:09 PM
Last modification on : Friday, March 22, 2019 - 3:12:02 PM

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Ahn Duc Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Robustness Improvement of Digital Circuits A New Hybrid Fault Tolerant Architecture. JNRDM'11: Journées Nationales du Réseau Doctoral de Microélectronique, Paris, France. ⟨lirmm-00679509⟩

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